Institute for Compound Semiconductors
The Institute for Compound Semiconductors (ICS) is an innovative concept working at the interface of academia and industry, providing world-class fabrication and testing facilities for users to develop and test their research, and to prepare it for exploitation by industry.
Equipment
Name | Make/Model | Details |
---|---|---|
Evaporator 4 | Lesker, Pro Line PVD200 | Thin film deposition system - thermal or e-beam metals -Al, Au, Ag, Cr, Zn, Ti, Ni. Sputter- Al, ITO and NiCr. |
Evaporator 5 | Lesker, Pro Line PVD200 | Thin film deposition system with UHV Egun system - thermal or e-beam metals- Al, Au, Ti, Pt, Ni, AuGe |
Evaporator 6 | BUHLER, Boxer, dielectric evaporator. | With ebeam gun - thermal or e-beam metals- Al, Au, Ti, SiO2. Sputter- SiO2 and SiN. |
ICP-RIE Etch tool | Oxford Instruments, PlasmPro 100 Cobra 300. | Plasma etch tool - III-V, GaN, SiN etching. |
Rapid Thermal Annealer | JIPELEC, Jetfirst 300 RTP Processor 3 x 400V. | Annealing of metal-semiconductor contacts over 300mm with a controlled N2 or O2 atmosphere. Thermocouple or pyrometer temperature control upto 1200 °C. |
6" mask aligner | SÜSS MicroTec, MA6 Mask Aligner. | Photolithographic tool with a 1000W Hg UV lamp. Soft, hard, vacuum and soft-vacuum contact modes. |
Wet Oxidation Furnace | AET, ALOX furnace. | With 6" chamber and susceptor. |
High Resolution SEM | Hitachi, Regulus8230 | High resolution SEM imaging, with EDX X-Flash and FlatQuad detectors. |
Axio Imager | Zeiss, Z2 Vario. | High quality microscope for imaging and measurement of critical dimensions over 200mm. Semi-auto mapping available. |
Atomic Layer Deposition (ALD) | Beneq, ALD, Thin Film System TFS200. | From summer 2019: ALD deposition of TiO2, TiN, Ta2O5, Al2O3, ZnO, SiO2, SiN, NiO, ITO, MoO. |
X-Ray Diffractometer (XRD) | X'Pert3 MRD XL. | To characterise thin film based optoelectronic devices. |
Get in touch
Chris Matthews
- ics@cardiff.ac.uk
- +44 (0)29 2251 0549
Location
-
Queen's Buildings
5 The Parade
Newport Road
CF24 3AA