Facilities
Designed to support cutting-edge research, our facility combines advanced electron microscopy techniques with extensive sample preparation capabilities.
The custom-built facility includes scanning electron microscopy (SEM), transmission electron microscopy (TEM), focussed ion beam (FIB) and aberration corrected scanning transmission electron microscopy (AC-STEM).
These include analytical capabilities such as X-ray Energy Dispersion Spectroscopy (X-EDS), Electron Energy Loss Spectroscopy (EELS), Electron diffraction, tomography, cryo -EM and in situ gas/liquid (S)TEM.
Sample preparation equipment includes mechanical sectioning and polishing, ion milling, sputter coating, plasma cleaning, glow discharge and plunge freezing.
