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White Light Interferometer

Make/model Micro XAM-100-HR white light interferometer
Details Enables the dimensional and surface roughness measurement of parts having an envelope of a few cm in all 3 dimensions. The vertical resolution of the microscope is a few nm while the lateral resolution is around 5 um
Facility
School School of Engineering

Get in touch

Dr Emmanuel Brousseau

Email
brousseaue@cardiff.ac.uk
Telephone
+44 (0)29 2087 5752

Location

Queen's Buildings
5 The Parade
Newport Road
CF24 3AA