Atomic Force Microscope
| Make/model | XE-100S SPM AFM PSIA Atomic force microscope |
|---|---|
| Details | Enables the dimensional and surface roughness measurement of parts having an envelope of a few cm in all 3 dimensions. The resolution is a few nm and the maximum area that can be inspected at once is 45um x 45um |
| Facility | |
| School | School of Engineering |
Get in touch
Dr Emmanuel Brousseau
- brousseaue@cardiff.ac.uk
- +44 (0)29 2087 5752
Location
Queen's Buildings
5 The Parade
Newport Road
CF24 3AA
5 The Parade
Newport Road
CF24 3AA