X-Ray Diffractometer (XRD)

Brand/model	X'Pert3 MRD XL.
Manylion	To characterise thin film based optoelectronic devices.
Cyfleuster	Institute for Compound Semiconductors
Ysgol	Yr Ysgol Ffiseg a Seryddiaeth

Cysylltwch

Queen's Buildings
5 The Parade
Heol Casnewydd
CF24 3AA