Environmental SEM (Scanning Electron Microscope)
Our FEI XL30 Field Emission Gun Environmental SEM (ESEM) is fitted with a secondary electron (SE) and back-scatter electron (BSE) detector along with an Oxford Instruments Inca Energy (EDS) X-ray analysis system.
| Brand/model | FEI XL30 ESEM FEG with Oxford Instruments INCA Energy |
|---|---|
| Manylion | High resolution field emmision gun sourced SEM with low vacuum and wet mode (Peltier stage) capability. Fitted with secondary, gaseous secondary and backscattered electron detectors and a fully standardised EDX spectrometer. |
| Cyfleuster | Electron microbeam facility |
| Ysgol | Ysgol Gwyddorau'r Ddaear a'r Amgylchedd |
- Resolution is better than 10 nm using the SE detector, and the BSE detector allows imaging of mean atomic mass variations.
- The EDS is used for standardless semi-quantitative point analyses and X-ray mapping of elements heavier than carbon.
- Variable pressure controls mean uncoated samples can be imaged along with gold- or carbon-coated samples.
- A gaseous secondary electron detector (GSE) combined with a Peltier cooling stage enables operation in ‘wet’ ESEM mode.
- The stage is adjustable in x-y-z dimensions and can be tilted allowing irregularly shaped samples to be accommodated.
Cysylltwch
Dr Duncan Muir
- muird1@cardiff.ac.uk
- +44 (0)29 2087 5059
Lleoliad
Main Building
Plas y Parc
CF10 3AT
Plas y Parc
CF10 3AT