Atomic Force/Magnetic Force Microscope
| Brand/model | Digital Instruments AFM/MFM |
|---|---|
| Manylion | Topographical and magnetic scans over areas typically 50 micron square. Resolution approximately 10nm. |
| Cyfleuster | Advanced Magnetic Materials Characterisation Facility |
| Ysgol | Yr Ysgol Peirianneg |
Cysylltwch
Dr Philip Anderson
- andersonpi1@cardiff.ac.uk
- +44 (0)29 2087 5564
Lleoliad
Queen's Buildings
5 The Parade
Heol Casnewydd
CF24 3AA
5 The Parade
Heol Casnewydd
CF24 3AA