Seyed Urman Ghozati
Myfyriwr ymchwil, Yr Ysgol Ffiseg a Seryddiaeth
- ghozatisu@cardiff.ac.uk
- Room C/3.10, Adeiladau'r Frenhines-Adeilad Canolog, 5 The Parade, Ffordd Casnewydd, Caerdydd, CF24 3AA
Mae'r cynnwys hwn ar gael yn Saesneg yn unig.
Trosolwg
Hi, my name is Seyed. I completed my BEng degree in Electronics, my first MSc in Electrical Power Engineering from Northumbria University, Newcastle, UK, in 2018, and my second MSc in compound semiconductor electronics as part of CDT programme in Compound semiconductor manufacturing from Cardiff University, Cardiff, in 2020.
I am currently a Ph.D. candidate at Cardiff University's Centre for High-Frequency Engineering (CHFE). I am working on a project titled "Microwave tuneable reflective termination with high power handling capability" under the supervision of Dr. Roberto Quaglia and Dr. Jonathan Lees. This project seeks to develop a method of solving reflection and matching problems in power amplifiers by using III-V microwave switches as low-loss, tuneable reflective loads.
Ymchil
Diddordebau ymchwil
My research interests include device design, fabrication, characterization, and modelling of III-V semiconductor technology, including high frequency and high-power devices.
Dysgu
During my studies I also did lab and cleanroom demonstration for MSc students.
- Microwave and Millimetre-Wave Integrated Circuit Design and Technology.
- Micro and Nano Engineering.
Traethawd ymchwil
Microwave tuneable reflective termination with high power handling capability
This project seeks to develop a method of solving reflection and matching problems in power amplifiers by using III-V microwave switches as low-loss, tuneable reflective loads.
Ffynhonnell ariannu
Engineering and Physical Sciences Research Council
Goruchwyliaeth
Dr Roberto Quaglia
Research Associate
Dr Jonathan Lees
Lecturer - Teaching and Research
Cyhoeddiadau
2022
- Varghese, A., Eblabla, A., Wu, Z., Ghozati, S. U. and Elgaid, K. 2022. GaN-HEMT on Si as a robust visible-blind UV detector with high responsivity. IEEE Sensors Journal 22(12), pp. 12307-12313. (10.1109/JSEN.2022.3170653)