Electron microbeam facility

Imaging and Characterisation of materials in millimetre to nanometre size.

Enw	Brand/model	Manylion
Analytical SEM (Scanning Electron Microscope)	Zeiss NTS S360 SEM with Oxford Instruments INCA Energy Plus	Conventional W filament, high vacuum, scanning electron microscope, calibrated with full set of element standards for analysis of polished material surfaces. Fitted with secondary and backscattered electron detectors and EDX and WDX spectrometers.
Environmental SEM (Scanning Electron Microscope)	FEI XL30 ESEM FEG with Oxford Instruments INCA Energy	High resolution field emmision gun sourced SEM with low vacuum and wet mode (Peltier stage) capability. Fitted with secondary, gaseous secondary and backscattered electron detectors and a fully standardised EDX spectrometer.
XRD (X-Ray Diffractometer)	Philips PW 1710 and 1840	Solid and powdered crystaline materials are identified against a database of more than 70,000 recorded phases. Quantification is possible.

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