Skip to content
Skip to navigation menu

 

FIB

Use:
Focused Ion Beam machine: a scanning electron microscope.  The FIB is used as a micro-machining tool, to modify or machine materials at the micro- and nanoscale. A FIB can also be used to fabricate micro and nano components by depositing  material via ion beam induced deposition.

Location:
MEC, Queens Building, Newport Road

Contact: