Surface Analysis @ Cardiff

 

Guide to Analysis Using CasaXPS for Kratos Aquired Data

Introduction

Firstly, thank you for using the EPSRC service here at Cardiff, and we hope that your visit was fruitful and informative as it was for us. However, XPS analysis, although relatively straight forward, should be treated with care, epscially if you are unawre of the features present in the spectra, together with transmission function correction and which sensitivity factors etc to use.

Here we will give a (brief!) guide to help you in the right direction on the analysis of your data, using CasaXPS software the demo version of which is available from the CasaXPS website, and will allow you to read and manipulate/analyse your saved data.

Should you wish to know more about XPS (and surface analysis in general), CasaXPS or quantification issues etc, we recommend the following texts/databases:

An Introduction to Surface Analysis by XPS and AES J.F.Watts and J.Wolstenholme (ISBN: 9780470847138)
Surface Analysis - The Principle Techniques J. Vickerman (ISBN: 9780470017647, second edition)
Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy Ed. D Briggs and J.T. Grant (ISBN: 1901019047)
Surface Analysis of Polymers by XPS and Static SIMS D. Briggs (ISBN: 9780521352222)
High Resolution XPS of Organic Polymers: The Scienta ESCA 300 Database G. Beamson and D. Briggs (ISBN: 0953784843)
Handbook of Surface and Interface Analysis: Methods for Problem-Solving J.C Riviere and S. Myhra (ISBN: 0824700805 first edition, 2nd ed now in press)

 

Analysing Data

Important things to remember for the analysis of XPS spectra are the corrections for the relative sensitivity factors of the elements/orbitals present in the sample and also the transmission function of the spectrometers analyser. Proper appreciation of these, will yield the true surface composition (within experimental certainty).

(1) Transmission Correction

The VAMAS format files supplied to you have the Transmission function of the Kratos Axis Ultra-DLD instrument (measured in all spectroscopic modes on a clean gold foil) stored within it, so no further work is required for this step. To ensure that at transmission function is present, call up the Region Properties dialogue (F5) and if the Automatic tick box is ticked, then there is a transmission function present, and this is being used. It is recommended to use this transmission function if using the Kratos modified Wagner sensitivity factors (see below).

Should you wish to use theoretically calculated sensitivity factors, or to use a Tougaard background subtraction, the spectrometer intensity response function must be determined absolutely and you should therefore use the transmission function as that developed by the NPL, and as seen in the paper by Walton and Fairley, then you may use our NPL derived transmission function. It is recommended to use this transmission function if you wish to use Scofield's relative sensitivity factors (see below).

(2) Sensitivity Factors

The sensitivity factors supplied with CasaXPS are those tabulated by Scofield (Journal of Electron Spectroscopy and Related Phenomena, Volume 8, Issue 2, 1976, Pages 129-137) , although widely used they require further correction, typically for angular and dependency and also the mean free path (MFP) of the photoelectrons, which is not always overly evident, especially if the geometry of the system is unknown. To overcome this the author of CasaXPS supplies a ready-made database of Kratos sensitivity factors, which are based on those by Wagner (Sensitivity factors for XPS analysis of surface atoms (Journal of Electron Spectroscopy and Related Phenomena, Volume 32, Issue 2, 1983, Pages 99-102) but modified to account for the geometry of the system (60 degrees). Since Wagner (and therefore modified Wagner) factors are based on measurements of many compounds, then the MFP dependence is already accounted for. To load the modified factors, you must do the following:

Should you wish to use the NPL transmission function from section (1) and therefore use the Scofield parameters, then together with the MFP dependency discussed above, you must account for the angular dependence of 60 degrees. This is done as follows:

©2007 Cardiff University and D Morgan