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Surface Analysis @ Cardiff

 

XPS Analysis Service

 

State of the Art Photoelectron Spectroscopy Analysis

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The School of Chemistry is pleased to offer an analytical service to universities, individuals and industry. The centre was established within the Wolfson Nanoscience Laboratory within the research school in 2006 as part of a major refurbishment. The aim of the centre is to provide a high quality, affordable analytical service for UK Universities.

Some Features of the Kratos Axis Ultra-DLD XPS System at Cardiff

  • Elemental identification and quantification
  • Chemical state information
  • Surface sensitive analysis to a depth of ca. 10nm
  • Spectroscopy scan areas from 300x700µm slot down to 15µm circular area
  • Fast spectroscopy with resolution better than 0.5eV
  • Parallel imaging with spatial resolution of 3µm  and chemical state deconvolution from stacked images at e.g. 0.1eV energy steps
  • Monochromatic X-ray source - The smaller spot size minimises the damage to sensitive samples and monochromation yields a better energy resolution. A standard dual anode source is also available.
  • Angle resolved measurements

 

 

  • Wide range of samples
  • Effective charge compensation so almost any type of sample, including non-conducting can be analysed
  • Sample size: typically ca. 1cm diameter discs or squares
  • Fast entry lock
  • Multi sample holders and programmable stage positions for routine analyses
  • Gas dosing
  • Argon ion gun for depth profiling thin layered samples and cleaning
  • Ultrahigh vacuum < 5x10-10 Torr
  • Full sample cooling and heating facilities
  • Metal evaporation facilities

 

The Kratos Axis Ultra-DLD system is the state of the art electron spectrometer combining X-ray photoelectron spectroscopy (XPS), micro XPS and imaging XPS. The system is equipped with both a monochromatic X-ray source and a dual Al-Mg anode. High collection efficiency and high spatial resolution is provided by means of a magnetic lens. For low collection angles an electrostatic lens can be used, either independently or in combination with the magnetic lens. Hemispherical analyser (HSA) provides both high energy resolution and high sensitivity for micro spectroscopy with spatial resolution <15 µm. With addition of the spherical mirror analyser (SMA), real time chemical state images down to 3 µm spatial resolution can be obtained in the parallel imaging mode.

The spectrometer is equipped with a delay-line detector (DLD), which replaces the need for the use of 8 channeltrons as on earlier instruments. The DLD, comprising a multi-channel plate stack above a delay-line anode, is used for photoelectron detection in both spectroscopy and imaging modes. The DLD provides, as compared with traditional detectors, ca. 10-20 times higher count rate in XPS spectroscopy mode, up to 120 detection channels, parallel spectral acquisition (snapshot mode) capability, and pulse counting parallel XPS imaging capability for lateral distribution of chemical species.

For increased throughput, all experimental data is analysed through networked PCs, using CasaXPS software, developed by Neal Fairley.

 

©2007 Cardiff University and D Morgan